2-Input NAND Gate – CD4011BE

CD4011BE NAND gates provide the system designer with direct implementation of the NAND function All inputs and outputs are buffered.

• Propagation delay time = 60 ns (typ.) at C_L = 50 pF, V_DD = 10 V
• Buffered inputs and outputs
• Standardized symmetrical output characteristics
• Maximum input current of 1 µA at 18 V over-full package temperature range; 100 nA at 18 V and 25°C
• 100% tested for quiescent current at 20 V
• 5-V, 10-V, and 15-V parametric ratings
• Noise margin (over full package temperature range:
  1 V at V_DD = 5 V
  2 V at V_DD = 10 V
  2.5 at V_DD = 15 V
• Meets all requirements of JEDEC Tentative Standard No. 13B, “Standard Specifications for Description of “B” Series CMOS Devices”

Datasheet